Reminder: SARFUS Presentation today at 10 am

Hi all --

There will be a presentation by Nanolane, a company with a new form of
optical microscopy capable of detecting nano-objects called
surface-enhanced ellipsometric contrast microscopy (SEEC)
(http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-15-13-8329).

The technique's power lies in the use of contrast-enhancing substrates
called Surf slides:http://www.nano-microscopy.com/. All sorts of
nanomaterials can be imaged and measured by SEEC and its mesuring
extension (quantitative SEEC), in particular
organics:http://pubs.acs.org/doi/abs/10.1021/la202703j . On top of that,
SEEC's high sensitivity to refractive index gradients makes it
particularly appealing to the imaging of microscopic objects such as cells.

This non-invasive/non-destructive technique is quite complementary to
other nanocharacterisation tools and could be used on a daily basis in
labs to take a first look at a system prior to turning to more involved
techniques.

This will be in the Allen 101 Conference room (not 101X) at 10 am on
Friday, April 13.

(I saw this at the MRS and invited them to Stanford. They have
commercially available substrates that can be processed using most
conventional fab methods -- and can be used to visualize nm-scale films
and features, such as DNA, ALD films, CNT's... Very cool.)

Mary

--
Mary X. Tang, Ph.D.
Stanford Nanofabrication Facility
Paul G. Allen Room 136, Mail Code 4070
Stanford, CA 94305
(650)723-9980
mtang@stanford.edu
http://snf.stanford.edu