I recently set up a probe station measuring I-V curve of
a two-terminal device with thin tunneling oxide, which
is called as a Magnetic Tunnel Junction. These devices
are very vulnerable to static charges and often blow up
after a few measurements. I am concerned if my setup
in the probe station is causing this problem. So, if you
have some experience dealing with this kind of delicate
measurements I would be very grateful for any advice.
Thank you,
Larkhoon
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