>All,
>
>Mayur Savla the Veeco Bay Area AFM Applications Engineer, will hold
>a seminar on:
>
>Wednesday, October 8 at 2:30 to 3:15 PM
>Allen Center for Integrated Systems
>CIS-X Cypress Auditorium (CISX101).
>
>He will discuss the best practices and set-up tips for optimizing
>scan parameters for surface roughness and step height measurements,
>Force curve measurements, Phase imaging, Fluid imaging and
>Electrical Measurements using AFM.
>
>Registration is required if you want to win the free sample pack of
>AFM tips. See the flyer for instructions.
>
>If you have any questions, please feel free to contact me or Paul
>Charell at <mailto:pcharell@veeco.com>pcharell@veeco.com.
>
>Regards,
>Ed
Tuesday, October 7, 2008
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