There is a Polytec seminar next week in Milipitas for anyone interested in hearing about their latest research. Contact Eric directly if there are any questions.
Cheers,
Scott
From: Eric Lawrence <E.Lawrence@polytec.com>
Date: Thu, May 12, 2011 at 10:20 AM
Subject: Tech Seminar
To: Scott Lee <wslee@stanford.edu>
Scott,
Hope everything is going well. We are having a Tech Seminar next week. Let me know if there is anyone interested from the SNF group. We have invited speakers showing their research, including Paul Cristman who is giving his presentation on Ultrasonic MEMS transducers.
We showed you most of what we have for MEMS when we visited last February, but this might be interesting in terms of new developments and other applications (bio and ultrasonic).
Best Regards,
Eric Lawrence
Northwest Territory Manager
** Join us for Polytec's Technology Seminar in the Bay Area on May 18th. **
Learn about our latest developments in Polytec's Technology.
For more information, click here.
From: Scott Lee [mailto:wslee@stanford.edu]
Sent: Tuesday, February 22, 2011 7:57 AM
To: labmembers@snf.stanford.edu; howegroup@lists.stanford.edu; nems-logic
Cc: Eric Lawrence
Subject: Dynamic Characterization of MEMS Using Laser Vibrometry, TODAY @ 2PM
On Tue, Feb 15, 2011 at 9:21 AM, Scott Lee <wslee@stanford.edu> wrote:
Hi all,
Next week, Eric Lawrence of Polytec will be demonstrating their latest laser vibrometry tools. If you have samples that you would like to characterize, let me know and we may be able to arrange it.
Thanks,
Scott
--------------------------------------------------------------------------------------------------------------------------
Technical Presentation: Dynamic Characterization of MEMS using Laser Vibrometry
When: Tuesday February 22, 2:00 PM
Where: Room 338X, PAUL G. ALLEN BUILDING (04-050), 420 VIA PALOU MALL
Polytec presents technology for dynamic characterization of MEMS. OurMicro System Analyzer (MSA-500) combines powerful tools for analysis and visualization of structural vibrations of MEMS. The MSA-500 features laser vibrometry for measurement of out-of-plane motion with resolution down to picometers and bandwidth out to MHz. Scanning measurements provide full-field mapping and 3D visualization of deflection shapes. The system also includes Strobe Video Microscopy for planar motion and White Light Interferometer for static topography measurements. Our latest capabilities include our Ultra High Frequency (UHF-120) Vibrometer featuring 1.2 GHz frequency bandwidth.
This technology is used throughout the MEMS research community. We present several characterization studies where our MSA has been instrumental in research and development of MEMS.
Our engineers will present new advances in our measurement technology and discuss potential MEMS applications you may have.
More information at: http://www.polytec.com/int/applications/micro-nano-technology/
Eric Lawrence
Northwest Territory Manager
Polytec Inc.
Irvine Technology Center
16400 Bake Parkway
Irvine, CA 92618
Cell: (714) 200-4019
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